TPS73618DBVR

1 FEATURES

• Stable with No Output Capacitor or Any Value or Type of Capacitor

• Input Voltage Range of 1.7V to 5.5V

• Ultra-Low Dropout Voltage: 75mV typ

• Excellent Load Transient Response—with or without Optional Output Capacitor

• New NMOS Topology Delivers Low Reverse Leakage Current

• Low Noise: 30µVRMS typ (10Hz to 100kHz)

• 0.5% Initial Accuracy

• 1% Overall Accuracy Over Line, Load, and Temperature

• Less Than 1µA max IQ in Shutdown Mode

• Thermal Shutdown and Specified Min/Max Current Limit Protection

• Available in Multiple Output Voltage Versions

– Fixed Outputs of 1.20V to 4.3V

– Adjustable Output from 1.20V to 5.5V

– Custom Outputs Available

2 APPLICATIONS

• Portable/Battery-Powered Equipment

• Post-Regulation for Switching Supplies

• Noise-Sensitive Circuitry such as VCOs

• Point of Load Regulation for DSPs, FPGAs, ASICs, and Microprocessors

3 DESCRIPTION

The TPS736xx family of low-dropout (LDO) linear voltage regulators uses a new topology: an NMOS pass element in a voltage-follower configuration. This topology is stable using output capacitors with low ESR, and even allows operation without a capacitor. It also provides high reverse blockage (low reverse current) and ground pin current that is nearly constant over all values of output current.

The TPS736xx uses an advanced BiCMOS process to yield high precision while delivering very low dropout voltages and low ground pin current. Current consumption, when not enabled, is under 1µA and ideal for portable applications. The extremely low output noise (30µVRMS with 0.1µF CNR) is ideal for powering VCOs. These devices are protected by thermal shutdown and foldback current limit.

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrate circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

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